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Nano-Metrology: The Art of Measuring X-Ray Mirrors With Slope Errors <100 Nrad

Review of Scientific Instruments - United States
doi 10.1063/1.4949272
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Abstract

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Categories
MedicineInstrumentation
Date

May 1, 2016

Authors
Simon G. AlcockIoana NisteaKawal Sawhney
Publisher

AIP Publishing


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