Surface State Capture Cross-Section at the Interface Between Silicon and Hafnium Oxide

Advances in Materials Science and Engineering - Egypt
doi 10.1155/2013/950439
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Hindawi Limited

Related search

Interface-State Capture Cross Section—Why Does It Vary So Much?

Applied Physics Letters
AstronomyPhysics
2015English

The 234U Neutron Capture Cross Section Measurement at the N_TOF Facility

2007English

Measurement and Analysis of the Am241 Neutron Capture Cross Section at the N_TOF Facility at CERN

Physical Review C
High Energy PhysicsNuclear
2018English

The Neutron Capture Cross Section of Erbium Isotopes

1954English

Proton Capture Cross Section ofGe72and Astrophysical Implications

Physical Review C
2015English

Atomic Scale Effects of Zirconium and Hafnium Incorporation at a Model Silicon/Silicate Interface by First Principles Calculations

IEEE Electron Device Letters
Electronic EngineeringOpticalElectricalMagnetic MaterialsElectronic
2001English

THERMAL NEUTRON CAPTURE CROSS SECTION OF Ce142

Canadian Journal of Chemistry
Organic ChemistryCatalysisChemistry
1956English

Fast Neutron Capture Cross Sections for Silicon.

1972English

The Impact of Organic Contamination on the Oxide-Silicon Interface

2011English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy