The Auto-Focus Method for Scanning Acoustic Microscopy by Sparse Representation

Sensing and Imaging - Germany
doi 10.1007/s11220-019-0255-x
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Springer Science and Business Media LLC

Related search

Auto-Focus of Optical Scanning Holographic Microscopy Using Partial Region Analysis

Korean Journal of Optics and Photonics
2011English

Scanning Acoustic Microscopy

Physics Today
AstronomyPhysics
1979English

Deep Learning for Sparse Scanning Electron Microscopy

Microscopy and Microanalysis
Instrumentation
2019English

Transmission Scanning Acoustic Microscopy for Tilted Plate Specimens

1985English

A Combination of Un-Supervised and Supervised Machine Learning Method for Auto-Thresholding Scanning Electron Microscopy Images

Microscopy and Microanalysis
Instrumentation
2019English

Non-Destructive Wafer-Level Bond Defect Identification by Scanning Acoustic Microscopy

Microsystem Technologies
Electronic EngineeringCondensed Matter PhysicsNanoscienceHardwareOpticalElectricalArchitectureMagnetic MaterialsNanotechnologyElectronic
2014English

Denoising Method Based on Sparse Representation for WFT Signal

Journal of Sensors
ControlSystems EngineeringInstrumentationElectricalElectronic Engineering
2014English

An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy Using Delauney Triangulation

Microscopy and Microanalysis
Instrumentation
2019English

Enhanced 2D Plotting Method for Scanning Probe Microscopy Imaging

Semiconductor Physics, Quantum Electronics and Optoelectronics
Electronic EngineeringOpticsMolecular Physics,OpticalElectricalAtomicMagnetic MaterialsElectronic
2011English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy