Experience With the IBM Sub-Angstrom STEM

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927603441196
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Sub-Angstrom Probe Size in HADF-STEM at 120KV

Microscopy and Microanalysis
Instrumentation
2002English

High Resolution Spectrometer Coupling to the Sub-Å IBM STEM

Microscopy and Microanalysis
Instrumentation
2003English

Current Status of the Sub-Angstrom Low-Voltage Electron Microscopy (SALVE) Project

Microscopy and Microanalysis
Instrumentation
2013English

The Stem Cell Experience

Cell Stem Cell
Molecular MedicineGeneticsCell Biology
2013English

Sub-Angstrom Characterization of the Structural Origin for High In-Plane Anisotropy in 2D GeS2

English

Generation of GW-Level, Sub-Angstrom Radiation in the LCLS Using a Second-Harmonic Radiator

2004English

PIMG--A ONE-DIMENSIONAL MULTIGROUP P$sub 1$ CODE FOR THE IBM-704

1959English

Spectra in the 60 )Angstrom) to 345 )Angstrom) Wavelength Region of Elements Injected Into the PLT Tokamak

1988English

Resolution Limit Measured by Fourier Transform: 0.61 Angstrom Information Transfer Through HAADF-STEM

Microscopy and Microanalysis
Instrumentation
2005English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy