Amanote Research

Amanote Research

    RegisterSign In

Atom Probe Tomography—A Cornerstone in Materials Characterization

MRS Bulletin - United Kingdom
doi 10.1557/mrs.2015.313
Full Text
Open PDF
Abstract

Available in full text

Categories
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
Date

January 1, 2016

Authors
Yaron AmouyalGuido Schmitz
Publisher

Cambridge University Press (CUP)


Related search

Atom Probe Tomography: A Technique for Nanoscale Characterization

Microscopy and Microanalysis
Instrumentation
2002English

Atom Probe Tomography Characterization of Multilayer Films

Microscopy and Microanalysis
Instrumentation
2003English

Nuclear Materials Characterization by Tomographic Atom Probe

EPJ Web of Conferences
AstronomyPhysics
2013English

Atom Probe Tomography and Correlative Microscopy: 3D Nanoscale Characterization of Metals, Minerals and Materials

JOM
Materials ScienceEngineering
2018English

Atom-Probe Tomography of Semiconductor Materials and Device Structures

MRS Bulletin
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
2009English

Mapping Isotopes in Nanoscale and Quantum Materials Using Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2016English

New Applications in Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2013English

The Mystery of Missing Species in Atom Probe Tomography of Composite Materials

Applied Physics Letters
AstronomyPhysics
2015English

An Introduction to Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2003English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy