Atom Probe Tomography Characterization of Multilayer Films

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927603442876
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Atom Probe Tomography: A Technique for Nanoscale Characterization

Microscopy and Microanalysis
Instrumentation
2002English

Atom Probe Tomography—A Cornerstone in Materials Characterization

MRS Bulletin
Materials ScienceTheoretical ChemistryCondensed Matter PhysicsPhysical
2016English

Three Dimensional Atom Probe Tomography of Nanoscale Thin Films, Interfaces and Particles

English

New Applications in Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2013English

An Introduction to Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2003English

Atom Probe Tomography: Accurate Quantification of Si/SiGe Interface Profiles via Atom Probe Tomography (Adv. Mater. Interfaces 21/2017)

Advanced Materials Interfaces
Mechanics of MaterialsMechanical Engineering
2017English

Introduction: Special Issue on Atom Probe Tomography

Microscopy and Microanalysis
Instrumentation
2007English

Atom Probe Tomography and Correlative Microscopy: 3D Nanoscale Characterization of Metals, Minerals and Materials

JOM
Materials ScienceEngineering
2018English

Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM

Microscopy and Microanalysis
Instrumentation
2013English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy