Amanote Research
Register
Sign In
A DSP-based Ramp Test for On-Chip High-Resolution ADC
doi 10.1109/ssst.2011.5753807
Full Text
Open PDF
Abstract
Available in
full text
Date
March 1, 2011
Authors
Wei Jiang
Vishwani D. Agrawal
Publisher
IEEE
Related search
On-Chip Hardware Accelerator for DSP Applications
International Journal of Recent Technology and Engineering
Engineering
Management of Technology
Innovation
A High Resolution 14-Bit ADC for Gammasphere Project
Linearity Enhancement Technique of Ramp Generator for ADC Testing
IEICE Electronics Express
Electronic Engineering
Condensed Matter Physics
Optical
Electrical
Magnetic Materials
Electronic
SWIFTS: On-Chip Very High Spectral Resolution Spectrometer
A DSP Based POD Implementation for High Speed Multimedia Communications
Eurasip Journal on Advances in Signal Processing
Hardware
Electronic Engineering
Signal Processing
Electrical
Architecture
High Resolution Nuclear Magnetic Resonance Spectroscopy for Lab-On-A-Chip Devices via Inductive Coupling
Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-On-Chip
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
High Resolution OFDM Channel Estimation With Low Speed ADC Using Compressive Sensing
An Investigation of the Use of a High Resolution ADC as a “Digital Biopotential Amplifier”
IFMBE Proceedings
Bioengineering
Biomedical Engineering