Erratum: “Spectroscopic Ellipsometry-Based Study of Optical Properties of Amorphous and Crystalline ZnSnO Alloys and Zn2SnO4 Thin Films Grown Using Sputtering Deposition: Dielectric Function and Subgap States” [J. Appl. Phys. 119, 135302 (2016)]

Journal of Applied Physics - United States
doi 10.1063/1.5022103
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