Built-In Loopback Test for IC RF Transceivers

IEEE Transactions on Very Large Scale Integration (VLSI) Systems - United States
doi 10.1109/tvlsi.2009.2019085
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Related search

RF/fiber Optical Interface for Microcellular Wireless Transceivers

English

Translation of Automotive Module RF Immunity Test Limits Into Equivalent IC Test Limits Using S-Parameter IC Models

2013English

Saddle Add-On Metallization for RF-IC Technology

IEEE Transactions on Electron Devices
Electronic EngineeringOpticalElectricalMagnetic MaterialsElectronic
2004English

Built in Self Test for RAM Using VHDL

2012English

Flying Qualities Built-In-Test for Unmanned Aerial Systems

English

On-Line Built-In Self-Test for Operational Faults

English

A Self-Reconfigurable Platform for Built-In Self-Test Applications

IEEE Transactions on Instrumentation and Measurement
Electronic EngineeringElectricalInstrumentation
2007English

Low Cost SU8 Based Above IC Process for High-Q RF Power Inductors Integration

Advanced Materials Research
2011English

A Novel Efficient TSV Built-In Test for Stacked 3D ICs

Turkish Journal of Electrical Engineering and Computer Sciences
Electronic EngineeringElectricalComputer Science
2018English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy