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A New Design-For-Test Technique for SRAM Core-Cell Stability Faults
doi 10.1109/date.2009.5090873
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Date
April 1, 2009
Authors
A. Ney
L. Dilillo
P. Girard
S. Pravossoudovitch
A. Virazel
M. Bastian
V. Gouin
Publisher
IEEE
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