Using Off-Axis Type Holography for CCD Camera Characterization

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927610053857
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

Exploring CCD Camera Parameters With Off-Axis Electron Holography

Microscopy and Microanalysis
Instrumentation
2011English

Characterization of Multilayer Ferromagnetic Nanowire Arrays Using Off-Axis Electron Holography

Microscopy and Microanalysis
Instrumentation
2013English

Single-Shot Self-Interference Incoherent Digital Holography Using Off-Axis Configuration

Optics Letters
OpticsAtomicMolecular Physics,
2013English

Magnetic Imaging of Skyrmions in FeGe Using Off-Axis Electron Holography

2016English

Quantitative Examination of Reverse-Biased Semiconductor Devices Using Off- Axis Electron Holography

Microscopy and Microanalysis
Instrumentation
2002English

Prospects for Off-Axis Electron Holography in the TEAM I Microscope

Microscopy and Microanalysis
Instrumentation
2011English

Live Measurement of Electrical Charge Density in Materials Using Off-Axis Electron Holography

Microscopy and Microanalysis
Instrumentation
2019English

Measuring Surface Charge on a Single Nanoparticle in Liquids Using Off-Axis Electron Holography

Microscopy and Microanalysis
Instrumentation
2018English

Direct Measurement of Barrier Asymmetry inAlOx∕ZrOymagnetic Tunnel Junctions Using Off-Axis Electron Holography

Physical Review B
2007English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy