Amanote Research
Register
Sign In
Prospects for Off-Axis Electron Holography in the TEAM I Microscope
Microscopy and Microanalysis
- United Kingdom
doi 10.1017/s1431927611007069
Full Text
Open PDF
Abstract
Available in
full text
Categories
Instrumentation
Date
July 1, 2011
Authors
M Linck
T Duden
U Dahmen
Publisher
Cambridge University Press (CUP)
Related search
Exploring CCD Camera Parameters With Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Magnetic Imaging of Skyrmions in FeGe Using Off-Axis Electron Holography
Exit-Surface Dependency of Defocus Measured by Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Characterization of Multilayer Ferromagnetic Nanowire Arrays Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Live Measurement of Electrical Charge Density in Materials Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Quantitative Examination of Reverse-Biased Semiconductor Devices Using Off- Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
Using Off-Axis Type Holography for CCD Camera Characterization
Microscopy and Microanalysis
Instrumentation
Strain Mapping at the Nanoscale Using Precession Electron Diffraction in Transmission Electron Microscope With Off Axis Camera
Applied Physics Letters
Astronomy
Physics
Measuring Surface Charge on a Single Nanoparticle in Liquids Using Off-Axis Electron Holography
Microscopy and Microanalysis
Instrumentation
