Erratum: Measurement of Electron Mobility in Epitaxial Heavily Phosphorus‐doped Silicon [J. Appl. Phys. 56, 2250 (1984)]
Journal of Applied Physics - United States
doi 10.1063/1.335508
Full Text
Open PDFAbstract
Available in full text
Date
March 15, 1985
Authors
Publisher
AIP Publishing