Amanote Research
Register
Sign In
IPF: In-Place X-Filling to Mitigate Soft Errors in SRAM-Based FPGAs
doi 10.1109/fpl.2011.95
Full Text
Open PDF
Abstract
Available in
full text
Date
September 1, 2011
Authors
Zhe Feng
Naifeng Jing
GengSheng Chen
Yu Hu
Lei He
Publisher
IEEE
Related search
Implementing a Safe Embedded Computing System in SRAM-based FPGAs Using IP Cores: A Case Study Based on the Altera NIOS-II Soft Processor
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10T Subthreshold SRAM
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Cost-Effective Soft-Error Protection for SRAM-based Structures in GPGPUs
Architectural Design Tradeoffs in SRAM-based TCAMs
IEICE Electronics Express
Electronic Engineering
Condensed Matter Physics
Optical
Electrical
Magnetic Materials
Electronic
Hybrid Prospective and Retrospective Head Motion Correction to Mitigate Cross-Calibration Errors
Magnetic Resonance in Medicine
Nuclear Medicine
Radiology
Imaging
WARM SRAM: A Novel Scheme to Reduce Static Leakage Energy in SRAM Arrays
Journal of Low Power Electronics
Electronic Engineering
Electrical
A VO-based Solution to the Origin of Soft X-Ray Emission in Obscured AGN
Proceedings of the International Astronomical Union
Astrophysics
Astronomy
Planetary Science
Space
Soft-Error in SRAM at Ultra-Low Voltage and Impact of Secondary Proton in Terrestrial Environment
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Modular Multi-Ported SRAM-based Memories
