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NBTI of Ge pMOSFETs: Understanding Defects and Enabling Lifetime Prediction
doi 10.1109/iedm.2014.7047166
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Date
December 1, 2014
Authors
J. Ma
W. Zhang
J. F. Zhang
B. Benbakhti
Z. Ji
J. Mitard
J. Franco
B. Kaczer
G. Groeseneken
Publisher
IEEE
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