Visualizing and Correcting Dynamic Specimen Processes in TEM Using a Direct Detection Device

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927613008593
Full Text
Abstract

Available in full text

Categories
Instrumentation
Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

A Plan-View TEM Specimen Preparation Method Using Focused Ion Beam

Microscopy and Microanalysis
Instrumentation
2017English

A High-Speed Electron-Counting Direct Detection Camera for TEM

Microscopy and Microanalysis
Instrumentation
2011English

A Newly Developed Fib System for Tem Specimen Preparation

Microscopy and Microanalysis
Instrumentation
2002English

TEM Specimen Preparation for the Physical Sciences

Microscopy and Microanalysis
Instrumentation
2003English

Comparison of Fib Tem Specimen Preparation Methods

Microscopy and Microanalysis
Instrumentation
2002English

Development of Direct Sandwich ELISA Test for Detection of Rotavirus in Clinical Specimen

Iranian Journal of Virology
2010English

Specimen Preparation Methods With FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB With Glass Manipulator^|^mdash;

Materia Japan
2012English

Correcting the Dynamic Call Graph Using Control-Flow Constraints

English

Secure WiFi-Direct Using Key Exchange for IoT Device-To-Device Communications in a Smart Environment

Future Internet
Computer NetworksCommunications
2019English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy