Comparison of Different TEM Sample Preparation Methods for YBa2Cu3O7-δ Type Materials

Microscopy Microanalysis Microstructures
doi 10.1051/mmm:019930040105100
Full Text
Abstract

Available in full text

Date
Authors
Publisher

EDP Sciences

Related search

Comparison of Fib Tem Specimen Preparation Methods

Microscopy and Microanalysis
Instrumentation
2002English

TEM Sample Preparation for Microcompressed Nanocrystalline Ni

Materials Transactions
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2008English

Optimization of Ion Millers for TEM Sample Preparation

Microscopy Today
1995English

FIB Dual-Beam Sample Preparation for TEM Observation

Microscopy and Microanalysis
Instrumentation
2003English

Automated S/Tem Sample Preparation for Semiconductor Process Support

Microscopy Today
2007English

Advances in Dual Beam TEM Sample Preparation

Microscopy and Microanalysis
Instrumentation
2002English

Comparison of Different Sample Preparation Techniques in TEM Observation of Microstructure of INCONEL Alloy 783 Subjected to Prolonged Isothermal Exposure

Microscopy and Microanalysis
Instrumentation
2003English

FIB TEM Sample Preparation of Deeply Buried Interfaces

Microscopy and Microanalysis
Instrumentation
2011English

Specimen Preparation Methods With FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB With Glass Manipulator^|^mdash;

Materia Japan
2012English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy