Erratum: “Micron-Scale Measurements of the Coefficient of Thermal Expansion by Time-Domain Probe Beam Deflection” [J. Appl. Phys. 104, 073509 (2008)]

Journal of Applied Physics - United States
doi 10.1063/1.5010943
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

Publisher's Note: “Laser Printed Micron-Scale Free Standing Laminate Composites: Process and Properties” [J. Appl. Phys. 108, 083526 (2010)]

Journal of Applied Physics
AstronomyPhysics
2010English

Comment on “Refractive Error Correction for in Situ Curvature Measurement Using Laser Beam Deflection Method” [J. Appl. Phys. 107, 013508 (2010)]

Journal of Applied Physics
AstronomyPhysics
2010English

Erratum: “Gold Nanorod Extinction Spectra” [J. Appl. Phys. 99, 123504 (2006)]

Journal of Applied Physics
AstronomyPhysics
2008English

Erratum: ‘‘A Novel Superlattice Infrared Source’’ [J. Appl. Phys. 63, 2856 (1988)]

Journal of Applied Physics
AstronomyPhysics
1991English

Response to “Comment on ‘Refractive Error Correction for in Situ Curvature Measurement Using Laser Beam Deflection Method’ [J. Appl. Phys. 107, 013508 (2010)]”

Journal of Applied Physics
AstronomyPhysics
2010English

Erratum: ‘‘Elimination of Slips on Silicon Wafer Edge in Rapid Thermal Process by Using a Ring Oxide’’ [J. Appl. Phys. 67, 7583 (1990)]

Journal of Applied Physics
AstronomyPhysics
1990English

Erratum: Misfit Dislocations and Critical Thickness of Heteroepitaxy [J. Appl. Phys.69, 7901 (1991)]

Journal of Applied Physics
AstronomyPhysics
1991English

Erratum:“Photoluminescence Induced by Thermal Annealing in SrTiO3 Thin Film” [Appl. Phys. Lett. 95, 241906 (2009)]

Applied Physics Letters
AstronomyPhysics
2010English

Erratum: “Cleaning Graphene Using Atomic Force Microscope” [J. Appl. Phys. 111, 064904 (2012)]

Journal of Applied Physics
AstronomyPhysics
2012English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy