Characterization of Ni-Base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques
Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927606065329
Full Text
Open PDFAbstract
Available in full text
Categories
Date
July 31, 2006
Authors
Publisher
Cambridge University Press (CUP)