The COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF a Ni-Base SUPERALLOY

Le Journal de Physique Colloques
doi 10.1051/jphyscol:1984962
Full Text
Abstract

Available in full text

Date
Authors
Publisher

EDP Sciences

Related search

Characterization of Ni-Base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques

Microscopy and Microanalysis
Instrumentation
2006English

Analytical Transmission Electron Microscopy

Reviews in Mineralogy and Geochemistry
PetrologyGeochemistry
2014English

Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.

Bulletin of the Japan Institute of Metals
1992English

Analytical Transmission Electron Microscopy in Minerals Processing

1981English

Characterization of Phosphorus Segregation in Neutron-Irradiated Pressure Vessel Steels by Atom Probe Field Ion Microscopy

Materials Research Society Symposium - Proceedings
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
1994English

Transmission Electron Microscopy

Springer Series in Optical Sciences
OpticalElectronicMagnetic Materials
2008English

Nanorobotics for Electron and Ion Microscopy

Microscopy and Microanalysis
Instrumentation
2003English

The Electron Microscopy Database: An Online Resource for Teaching and Learning Quantitative Transmission Electron Microscopy

Microscopy Today
2009English

Reactive Ion Etching: Optimized Diamond Membrane Fabrication for Transmission Electron Microscopy

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
SurfacesElectronic EngineeringCondensed Matter PhysicsInstrumentationElectronicOpticalMaterials ChemistryElectricalMagnetic MaterialsFilmsProcess ChemistryCoatingsTechnology
2013English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy