Secondary Ion Mass Spectrometry Study of Erbium Titanium Codiffusion in Lithium Niobate

IEEE Photonics Technology Letters - United States
doi 10.1109/lpt.2014.2322500
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Related search

Secondary Ion Mass Spectrometry (SIMS)

Zairyo to Kankyo/ Corrosion Engineering
SurfacesAlloysMetalsMaterials ChemistryElectrochemistryFilmsCoatings
1993English

Secondary Ion Mass Spectrometry (SIMS)

English

Time of Flight Secondary Ion Mass Spectrometry: Chemical Imaging

Microscopy and Microanalysis
Instrumentation
2016English

Characterization of Electrodeposited Metal Coatings by Secondary Ion Mass Spectrometry

Surface and Coatings Technology
SurfacesCondensed Matter PhysicsInterfacesMaterials ChemistryFilmsCoatingsChemistry
2006English

Depth Profiling of Trace Constituents Using Secondary Ion Mass-Spectrometry

Journal of Research of the National Bureau of Standards
1988English

20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX)

Biointerphases
Materials ScienceAstronomyGeneticsMolecular BiologyBiochemistryBiomaterialsChemistryPhysics
2016English

Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities

Microscopy and Microanalysis
Instrumentation
2017English

Iterative Clustering and Classification Analysis of Secondary Ion Mass Spectrometry Images

Microscopy and Microanalysis
Instrumentation
2010English

Internal Energy Transfer to Secondary Ions in Electrospray Droplet Impact/Secondary Ion Mass Spectrometry

Journal of the Mass Spectrometry Society of Japan
2008English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy