In Situ Real-Time Studies of Oxygen Incorporation in Complex Oxide Thin Films Using Spectroscopic Ellipsometry and Ion Scattering and Recoil Spectrometry

Materials Research Society Symposium - Proceedings - United States
doi 10.1557/proc-619-141
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Cambridge University Press (CUP)

Related search

In-Situ Spectroscopic Ellipsometry for Studies of Thin Films and Membranes

English

Spectroscopic Ellipsometry. Real-Time Monitoring and Control of Thin-Film Growth Using Spectroscopic Ellipsometry.

Hyomen Kagaku
1997English

Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real-Time Spectroscopic Ellipsometry

Applied Physics Letters
AstronomyPhysics
2009English

Morphology and Spectroscopic Ellipsometry of PMMA Thin Films

Applied Physics Research
2017English

Modeling the Transport Properties of Epitaxially Grown Thermoelectric Oxide Thin Films Using Spectroscopic Ellipsometry

Applied Physics Letters
AstronomyPhysics
2012English

Analysis of Controlled Mixed-Phase (Amorphous+microcrystalline) Silicon Thin Films by Real Time Spectroscopic Ellipsometry

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
SurfacesFilmsInterfacesCondensed Matter PhysicsCoatings
2009English

Studies on Inx(As2Se3)1-X Thin Films Using Variable Angle Spectroscopic Ellipsometry (VASE)

Materials Science-Poland
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2015English

In-Situ Spectroscopic Studies of Electrochromic Hydrated Nickel Oxide Films

Solar Energy Materials
1989English

Aging of Oxygen-Treated Trimethylsilane Plasma-Polymerized Films Using Spectroscopic Ellipsometry

Journal of Atomic, Molecular, and Optical Physics
2011English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy