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Reverse Gate Bias Stress on High-Voltage AlGaN/GaN-on-Si Heterostructure FETs
doi 10.7567/ssdm.2012.f-9-1
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Date
September 27, 2012
Authors
S. Choi
J. Lee
H. Yoon
H. Cha
H. Kim
Publisher
The Japan Society of Applied Physics