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Defects and Polytypism in SiC: The Role of Diffuse X-Ray Scattering
doi 10.1063/1.3518307
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Date
January 1, 2010
Authors
A. Boulle
D. Dompoint
I. Galben-Sandulache
D. Chaussende
Gabriel Ferro
Paul Siffert
Publisher
AIP
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