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Diffuse X-Ray Scattering From Defects in GaN Epitaxial Layers

Acta Crystallographica Section A Foundations of Crystallography
doi 10.1107/s0108767311098217
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Abstract

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Date

August 22, 2011

Authors
V. HolýM. Barchuk
Publisher

International Union of Crystallography (IUCr)


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