Probing Depth Study of Conversion Electron/He Ion Yield XAFS Spectroscopy on Strontium Titanate Thin Films.

Analytical Sciences - Japan
doi 10.2116/analsci.15.255
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Japan Society for Analytical Chemistry

Related search

Depth-Dependent Calcium Speciation in Individual Aerosol Particles by Combination of Fluorescence Yield and Conversion Electron Yield XAFS Using X-Ray Microbeam

Chemistry Letters
Chemistry
2016English

Aberration-Corrected HRTEM of Defects in Strained Lanthanum Cuprate Thin Films Grown on Strontium Titanate

Microscopy and Microanalysis
Instrumentation
2006English

Quantitative Analysis of Yttrium Barium Copper Oxide Films on Strontium Titanate

Microscopy and Microanalysis
Instrumentation
2002English

Localized Electronic States Induced by Defects and Possible Origin of Ferroelectricity in Strontium Titanate Thin Films

Applied Physics Letters
AstronomyPhysics
2009English

Mobility Oscillations of Electrons on Thin He Films

Canadian Journal of Physics
AstronomyPhysics
1987English

Growth and Superconductivity of Niobium Titanium Alloy Thin Films on Strontium Titanate (001) Single-Crystal Substrates for Superconducting Joints

Scientific Reports
Multidisciplinary
2018English

Probing Molecular Orientations in Thin Films by X-Ray Photoelectron Spectroscopy

AIP Advances
NanotechnologyAstronomyPhysicsNanoscience
2018English

Transition From Reconstruction Toward Thin Film on the (110) Surface of Strontium Titanate

English

Transition From Reconstruction Toward Thin Film on the (110) Surface of Strontium Titanate

English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy