Electron Backscatter Diffraction Analysis for Polarization of SrBi2(Ta,Nb)2O9Ferroelectric Capacitors in Submicron Small Area

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes - Japan
doi 10.1143/jjap.47.262
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Japan Society of Applied Physics


Related search