Amanote Research
Register
Sign In
Atom Probe Field Ion Microscope Study of the Range and Diffusivity of Helium in Tungsten
doi 10.2172/6427378
Full Text
Open PDF
Abstract
Available in
full text
Date
August 1, 1978
Authors
A. Wagner
Publisher
Office of Scientific and Technical Information (OSTI)
Related search
An Atom-Probe Field Ion Microscope
Vacuum
Surfaces
Instrumentation
Coatings
Condensed Matter Physics
Films
The Quantitative Compositional Analysis With Atom-Probe Field Ion Microscope and an Application to Metallurgy.
Bulletin of the Japan Institute of Metals
A Specimen-Exchange Device for an Ultra-High Vacuum Atom-Probe Field-Ion Microscope
Vacuum
Surfaces
Instrumentation
Coatings
Condensed Matter Physics
Films
A Differentially-Pumped Low-Energy Ion-Beam System for an Ultra-High Vacuum (UHV) Atom-Probe Field-Ion Microscope
Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.
Bulletin of the Japan Institute of Metals
Zero-Field Level Crossing in the Helium Atom
Canadian Journal of Physics
Astronomy
Physics
Correlated Ion Analysis and the Interpretation of Atom Probe Mass Spectra
Ultramicroscopy
Instrumentation
Optics
Molecular Physics,
Optical
Atomic
Magnetic Materials
Electronic
The COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF a Ni-Base SUPERALLOY
Le Journal de Physique Colloques
Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope
Microscopy and Microanalysis
Instrumentation
