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Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Advances in OptoElectronics - United States
doi 10.1155/2011/648487
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Abstract

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Categories
Electronic EngineeringOpticalElectricalMagnetic MaterialsElectronic
Date

January 1, 2011

Authors
Joon Huang ChuahDavid Holburn
Publisher

Hindawi Limited


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