New Possibilities for In-Situ Electrical Characterization of Nanosamples at Different Temperatures Combined With Simultaneous TEM Observations
Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927613004273
Full Text
Open PDFAbstract
Available in full text
Categories
Date
August 1, 2013
Authors
Publisher
Cambridge University Press (CUP)