The Nature of Hypervalent Bonding in Compounds of Pentacoordinated Silicon as Found From X-Ray Diffraction and Quantum Chemical Calculations

Acta Crystallographica Section A Foundations of Crystallography
doi 10.1107/s0108767304096497
Full Text
Abstract

Available in full text

Date
Authors
Publisher

International Union of Crystallography (IUCr)

Related search

Chemical Bonding in Hypervalent Silicon and Germanium Compounds

Acta Crystallographica Section A Foundations of Crystallography
2005English

Strain in Buried Quantum Wires: Analytical Calculations and X-Ray Diffraction Study

Physical Review B
2002English

X‐ray Photoelectron Spectroscopic Studies of the Chemical Nature of As‐prepared and NaOH‐treated Porous Silicon Layer

Applied Physics Letters
AstronomyPhysics
1993English

X-Ray Diffraction Patterns of Lead Compounds

Acta Crystallographica
1954English

X-Ray Powder Diffraction of Einsteinium Compounds

1979English

X‐ray Photoelectron Diffraction of (100)‐oriented Chemical Vapor Deposited Diamond Films on Silicon (100)

Applied Physics Letters
AstronomyPhysics
1995English

The Description of Chemical Bonding From AB Initio Calculations

Annual Review of Physical Chemistry
Theoretical ChemistryPhysical
1978English

Oriented Independent Atoms From X-Ray Diffraction Data. Intra- And Intermolecular Bonding in Organic Crystals

Acta Crystallographica Section A Foundations of Crystallography
1993English

A Precise X-Ray Diffraction Study of Elastically Deformed Silicon Monocrystals

Journal of Applied Crystallography
BiochemistryGeneticsMolecular Biology
1975English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy