X‐ray Photoelectron Spectroscopic Studies of the Chemical Nature of As‐prepared and NaOH‐treated Porous Silicon Layer

Applied Physics Letters - United States
doi 10.1063/1.109597
Full Text
Abstract

Available in full text

Date
Authors
Publisher

AIP Publishing

Related search

X-Ray Photoelectron Spectroscopic Investigation of Conducting Polymer Blends

Analytical and Bioanalytical Chemistry
BiochemistryAnalytical Chemistry
1996English

X-Ray PHOTOELECTRON AND AUGER ELECTRON SPECTROSCOPIC STUDY OF Mg-Montmorillonite

Chemistry Letters
Chemistry
1981English

An X-Ray Photoelectron Spectroscopic Study of Dioxime Metal Complexes

Bulletin of the Chemical Society of Japan
Chemistry
1978English

X‐ray Photoelectron Diffraction of (100)‐oriented Chemical Vapor Deposited Diamond Films on Silicon (100)

Applied Physics Letters
AstronomyPhysics
1995English

X-Ray Photoelectron Spectroscopic Study of Iron, Cobalt, Nickel, Copper, and Platinum

Physical Review Letters
AstronomyPhysics
1968English

Surface Oxidation of Iron Monosulphide: An X-Ray Photoelectron Spectroscopic Study

Mineralogical Magazine
PetrologyGeochemistry
1998English

The Nature of Hypervalent Bonding in Compounds of Pentacoordinated Silicon as Found From X-Ray Diffraction and Quantum Chemical Calculations

Acta Crystallographica Section A Foundations of Crystallography
2004English

Surface Functionality Features of Porous Silicon Prepared and Treated in Different Conditions

Journal of Nanomaterials
Materials ScienceNanotechnologyNanoscience
2016English

Chemical Shift of Cesium Compounds by X-Ray Photoelectron Spectroscopy

Hyomen Kagaku
2013English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy