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HRTEM and EELS Study in GaN-based Diluted Magnetic Semiconductor
Microscopy and Microanalysis
- United Kingdom
doi 10.1017/s1431927605505099
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Categories
Instrumentation
Date
August 1, 2005
Authors
R T Huang
C F Hsu
J J Kai
F R Chen
T S Chin
Publisher
Cambridge University Press (CUP)
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