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Investigation of Degradation of GaN Based Semiconductor Structures

Proceedings of Tomsk State University of Control Systems and Radioelectronics
doi 10.21293/1818-0442-2017-20-4-23-25
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Abstract

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Date

January 1, 2017

Authors
S.G. EkhaninA.A. Tomashevich
Publisher

Tomsk State University of Control Systems and Radioelectronics (TUSUR)


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