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Point and Extended Defects in Ultra Wide Band Gap Β-Ga2O3 Interfaces

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927617007930
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Abstract

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Categories
Instrumentation
Date

July 1, 2017

Authors
Jared M JohnsonSriram KrishnamoorthySiddharth RajanJinwoo Hwang
Publisher

Cambridge University Press (CUP)


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