Amanote Research

Amanote Research

    RegisterSign In

EELS Characterization of Tin Oxides

Microscopy and Microanalysis - United Kingdom
doi 10.1017/s1431927603444279
Full Text
Open PDF
Abstract

Available in full text

Categories
Instrumentation
Date

July 24, 2003

Authors
M.S. MorenoR.F. Egerton
Publisher

Cambridge University Press (CUP)


Related search

EELS Characterization of Highly Irradiated PVC

Microscopy and Microanalysis
Instrumentation
2002English

Parallel EELS Characterization of TiC Commercial Powder

Microscopy and Microanalysis
Instrumentation
2002English

Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS

Microscopy and Microanalysis
Instrumentation
2010English

Probing the Metal-Insulator Transitions in Complex Oxides With EELS Near- Edge Structures

Microscopy and Microanalysis
Instrumentation
2002English

Characterization of Boron Containing Graphite Using TEM and EELS

Microscopy and Microanalysis
Instrumentation
2002English

Synthesis and Characterization of Tin Monosulphide Nanoparticles

Advanced Science, Engineering and Medicine
2013English

Nanoparticles of Metals Oxides Preparation and Characterization

2016English

Synthesis and Characterization of Tin Oxide: A Review

International Journal for Research in Applied Science and Engineering Technology
2017English

Tin Whiskers: Electron Microscopy and EBSD Characterization

Microscopy and Microanalysis
Instrumentation
2010English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy