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Characterization of Boron Containing Graphite Using TEM and EELS
Microscopy and Microanalysis
- United Kingdom
doi 10.1017/s143192760210599x
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Categories
Instrumentation
Date
August 1, 2002
Authors
J.S. Kim
S.J. Kim
G.H. Kim
C.H. Chun
Publisher
Cambridge University Press (CUP)