Correction of Surface Aberration in Strain Scanning Method With Analyzer

Zairyo/Journal of the Society of Materials Science, Japan - Japan
doi 10.2472/jsms.55.101
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Society of Materials Science, Japan

Related search

Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?

Microscopy and Microanalysis
Instrumentation
2009English

Spherical Aberration Correction in TEM

Hyomen Kagaku
2013English

Aberration Correction of Coherent Imagery

2012English

Aberration Correction and Electron Holography

Microscopy and Microanalysis
Instrumentation
2009English

STEM Aberration Correction: Where Next?

Microscopy and Microanalysis
Instrumentation
2002English

Correction of Distortion Aberration in Electron Magnetic Lenses

International Journal of Applied Physics
2016English

Spectral Measurement Method With FFT Analyzer

Journal of the Illuminating Engineering Institute of Japan (Shomei Gakkai Shi)
Electronic EngineeringElectrical
1989English

Initial Results From Aberration Correction in STEM

Microscopy and Microanalysis
Instrumentation
2002English

Precise Correction of Lateral Chromatic Aberration in Images

Lecture Notes in Computer Science
Computer ScienceTheoretical Computer Science
2014English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy