Amanote Research
Register
Sign In
Generation of High Quality Tests for Robustly Untestable Path Delay Faults
IEEE Transactions on Computers
- United States
doi 10.1109/12.545968
Full Text
Open PDF
Abstract
Available in
full text
Categories
Hardware
Architecture
Mathematics
Computational Theory
Theoretical Computer Science
Software
Date
January 1, 1996
Authors
A. Krstic
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Related search
Local Generation of High-Quality Human Resources for Health Research
Bulletin of the World Health Organization
Environmental
Public Health
Occupational Health
Automatic March Tests Generations for Static Linked Faults in SRAMs
Path Analysis of High-Quality Development in Art Financial Market
Cosmology: The Untestable Multiverse
Nature
Multidisciplinary
Simple Stability Tests for Second Order Delay Differential Equations
Bulletin of the South Ural State University. Ser. Computer Technologies, Automatic Control & Radioelectronics
Genetic Tests by Next Generation Sequencing in Children With Developmental Delay and/or Intellectual Disability
Korean Journal of Pediatrics
Child Health
Pediatrics
Perinatology
Spectral RTL Test Generation for Gate-Level Stuck-At Faults
Proceedings of the Asian Test Symposium
Electronic Engineering
Electrical
Baking Quality Tests for Flour
Nature
Multidisciplinary
CASPaR: Congestion Avoidance Shortest Path Routing for Delay Tolerant Networks
International Journal of Distributed Sensor Networks
Computer Networks
Engineering
Communications
