Excellent Rectifying Properties of the N-3c-SiC/P-Si Heterojunction Subjected to High Temperature Annealing for Electronics, MEMS, and LED Applications

Scientific Reports - United Kingdom
doi 10.1038/s41598-017-17985-9
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Springer Science and Business Media LLC

Related search

Mechanical Properties of 3c-SiC Films for MEMS Applications

Materials Research Society Symposium - Proceedings
Mechanics of MaterialsMaterials ScienceCondensed Matter PhysicsMechanical Engineering
2007English

Low Cost, P-ZnO/N-Si, Rectifying, Nano Heterojunction Diode: Fabrication and Electrical Characterization

Beilstein Journal of Nanotechnology
Electronic EngineeringMaterials ScienceNanoscienceElectricalNanotechnologyAstronomyPhysics
2014English

Thermoresistance of P -Type 4h-SiC Integrated MEMS Devices for High-Temperature Sensing

Advanced Engineering Materials
Materials ScienceCondensed Matter Physics
2019English

Femtosecond Pulsed Laser Ablation and Patterning of 3c-SiC Films on Si Substrates for MEMS Fabrication

English

Influence of Divacancy-Oxygen Defects on Recombination Properties of N-Si Subjected to Irradiation and Subsequent Annealing

Ukrainian Journal of Physics
AstronomyPhysics
2018English

Comparative Study of RESURF Si/SiC LDMOSFETs for High-Temperature Applications Using TCAD Modeling

IEEE Transactions on Electron Devices
Electronic EngineeringOpticalElectricalMagnetic MaterialsElectronic
2017English

Electric Properties of Carbon-Doped N-Type Β-FeSi2/P-Type Si Heterojunction Diodes

2015English

High Rectifying Behavior in Al/Si Nanocrystal-Embedded SiOxNy/p-Si Heterojunctions

Semiconductor Science and Technology
Electronic EngineeringCondensed Matter PhysicsOpticalMaterials ChemistryElectricalMagnetic MaterialsElectronic
2011English

Improved Annealing Process for 6h-SiC P+-N Junction Creation by Al Implantation

Materials Science Forum
2000English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy