Decompression Hardware Determination for Test Volume and Time Reduction Through Unified Test Pattern Compaction and Compression

doi 10.1109/vtest.2003.1197641
Full Text
Abstract

Available in full text

Date

Unknown

Authors
Publisher

IEEE Comput. Soc

Related search

2.2.1 Test Time Reduction by Optimal Test Sequencing1

INCOSE International Symposium
2006English

Test Time Reduction Technique for Dynamic RAMs

IEEJ Transactions on Electronics, Information and Systems
Electronic EngineeringElectrical
1987English

How Effective Are Compression Codes for Reducing Test Data Volume?

English

Test Pattern Ordering and Selection for High Quality Test Set Under Constraints

IEICE Transactions on Information and Systems
Electronic EngineeringPattern RecognitionHardwareComputer VisionElectricalArchitectureArtificial IntelligenceSoftware
2012English

Scratch Collapse Test: A New Clinical Test for Peripheral Nerve Compression

Arquivos de Neuro-Psiquiatria
Biological PsychiatryNeurology
2015English

An Integrated Technique for Test Vector Selection and Test Scheduling Under Test Time Constraint

English

Developing Test Systems for Multi-Modules Hardware Designs

2011English

Compression Bending Test Method for Advanced Composites.

Journal of the Japan Society for Aeronautical and Space Sciences
1993English

Determination of Optimal Formulation for Extrusion Granulation by Compression Test of Wet Kneaded Mass

Chemical and Pharmaceutical Bulletin
MedicineDrug DiscoveryChemistry
2004English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2025 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy