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Publications by A. Orailoglu
Redundancy and Testability in Digital Filter Datapaths
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Electrical
Software
Computer Graphics
Computer-Aided Design
Electronic Engineering
Computer-Aided Design of Fault-Tolerant VLSI Systems
IEEE Design & Test of Computers
Deterministic Partitioning Techniques for Fault Diagnosis in Scan-Based BIST
Diagnosis for Scan-Based BIST: Reaching Deep Into the Signatures
Nanofabric Topologies and Reconfiguration Algorithms to Support Dynamically Adaptive Fault Tolerance
Decompression Hardware Determination for Test Volume and Time Reduction Through Unified Test Pattern Compaction and Compression