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Publications by A.Y. Borisevich
Studies of Single Dopant Atoms on Nanocrystalline Γ-Alumina Supports by Aberration-Corrected Z-Contrast STEM and First Principles Calculations
Microscopy and Microanalysis
Instrumentation
Related publications
Depth Sectioning of Individual Dopant Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Applied Physics Letters
Astronomy
Physics
Aberration-Corrected HAADF-STEM Studies of Nano-Gold/Titania Catalysts
Microscopy and Microanalysis
Instrumentation
Efficient Elastic Imaging of Single Atoms With Aberration-Corrected Scanning Transmission Electron Microscopy
Microscopy and Microanalysis
Instrumentation
On Proper Phase Contrast Imaging in Aberration Corrected TEM
Microscopy and Microanalysis
Instrumentation
EDX Analysis of Low Concentration Dopant Using HD-2700 Aberration Corrected STEM Equipped With Dual SDD
Microscopy and Microanalysis
Instrumentation
Ultra-High Vacuum Aberration-Corrected STEM for In-Situ Studies
Microscopy and Microanalysis
Instrumentation
Aberration-Corrected STEM for Elemental Mapping
Microscopy and Microanalysis
Instrumentation
Nanomilling for Aberration – Corrected TEM and HAADF STEM
Microscopy and Microanalysis
Instrumentation
High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM
Microscopy and Microanalysis
Instrumentation
