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Publications by Akihiko Yamada
Design for Testability of LSI
IEEJ Transactions on Electronics, Information and Systems
Electronic Engineering
Electrical
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Design of Modular Digital Circuits for Testability
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A Secure Architecture of Design for Testability Structures
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Testability Measurement Model for Object Oriented Design (Tmmood)
International Journal of Computer Science and Information Technology
Design for Testability of Circuits and Systems; An Overview
The International Conference on Electrical Engineering
Design for Testability of Integrated Circuits and Project Protection Difficulties
Russian Technological Journal
A Baseline-Based BIST Design Model for Software Testability
Methodological Research on Design for Testability of Mixed-Signal IC
Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution
IEEE Transactions on Computers
Hardware
Architecture
Mathematics
Computational Theory
Theoretical Computer Science
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Design for Testability Implementation of Dual Rail Half Adder Based on Level Sensitive Scan Cell Design
International Journal of Recent Trends in Engineering and Research
