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Publications by Alan J. Craven
Experimental Evaluation of Interfaces Using Atomic-Resolution High Angle Annular Dark Field (HAADF) Imaging
Ultramicroscopy
Instrumentation
Optics
Molecular Physics,
Optical
Atomic
Magnetic Materials
Electronic
How to Set Up Your STEM for EELS at Very High Energy Losses
Microscopy and Microanalysis
Instrumentation
Related publications
On the Limits of High Angle Annular Dark Field (HAADF) Tomography; Electron Beam Damage
Microscopy and Microanalysis
Instrumentation
Variable-Angle High-Angle Annular Dark-Field Imaging: Application to Three-Dimensional Dopant Atom Profiling
Scientific Reports
Multidisciplinary
Time-Resolved Annular Dark Field Imaging of Catalyst Nanoparticles
ChemPhysChem
Theoretical Chemistry
Physical
Optics
Atomic
Molecular Physics,
Characterization of Β′ Precipitate Phase in Mg-2 At%Y Alloy Aged to Peak Hardness Condition by High-Angle Annular Detector Dark-Field Scanning Transmission Electron Microscopy (HAADF-STEM)
Materials Transactions
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
Microscopy Today
High Resolution NMR Imaging Using a High Field Yokeless Permanent Magnet
Magnetic Resonance in Medical Sciences
Nuclear Medicine
Radiology
Imaging
Virtual Dark-Field and Virtual High Angle Angular Dark Field Images Reconstructed From Electron Diffraction Patterns
Deconvolution Process of High-Resolution HAADF STEM Images
Microscopy and Microanalysis
Instrumentation
Determination of Atomic Structure at Surfaces and Interfaces by High-Resolution Stem
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
