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Publications by Alex Ulyanenkov
Characterization of SiGe Thin Films Using a Laboratory X-Ray Instrument
Journal of Applied Crystallography
Biochemistry
Genetics
Molecular Biology
Characterization of Dislocations in Germanium Layers Grown on (011)- And (111)-Oriented Silicon by Coplanar and Noncoplanar X-Ray Diffraction
Journal of Applied Crystallography
Biochemistry
Genetics
Molecular Biology
Related publications
Characterization of Thin Polymer Films by Neutron and X-Ray Reflectometry
Kobunshi
Materials Science
Polymers
Plastics
Chemical Engineering
Environmental Science
Observation of Molecular Layering in Thin Liquid Films Using X-Ray Reflectivity
Physical Review Letters
Astronomy
Physics
Investigation of Phase Miscibility of CoCrPt Thin Films Using Anomalous X-Ray Scattering and Extended X-Ray Absorption Fine Structure
Applied Physics Letters
Astronomy
Physics
Optical and Electrical Characterization of BixSe1−x Thin Films
Materials Science-Poland
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Soft X-Ray Magnetic Scattering Study of Thin Films and Multilayers
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Characterization of Self-Assembled Organic Films Using Differential Charging in X-Ray Photoelectron Spectroscopy
Probing Molecular Orientations in Thin Films by X-Ray Photoelectron Spectroscopy
AIP Advances
Nanotechnology
Astronomy
Physics
Nanoscience
X-Ray Induced Modification of Electronic Properties of Boron Nitride Thin Films
Journal of Applied Physics
Astronomy
Physics
Depth Dependence of Residual Strains in Polycrystalline Mo Thin Films Using High‐resolution X‐ray Diffraction
Journal of Applied Physics
Astronomy
Physics
