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Publications by András E. Vladár
Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2
Microscopy and Microanalysis
Instrumentation
Nanomanufacturing Concerns About Measurements Made in the SEM Part IV: Charging and Its Mitigation
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Thin Film and Multilayer Scintillators for Low Voltage Backscattered Electron Imaging in the Scanning Electron Microscope
Microscopy and Microanalysis
Instrumentation
Imaging of Shallow Surface Topography by the Low-Loss Electron (LLE) Method in the Scanning Electron Microscope
Microscopy Today
Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope
Microscopy and Microanalysis
Instrumentation
Cell Surface and Cell Outline Imaging in Plant Tissues Using the Backscattered Electron Detector in a Variable Pressure Scanning Electron Microscope
Plant Methods
Biotechnology
Plant Science
Genetics
Atomic-Resolution Electron Energy-Loss Spectroscopy in the Scanning Transmission Electron Microscope
Journal of Microscopy
Forensic Medicine
Pathology
Histology
Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope
Advances in OptoElectronics
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Scanning Electron Microscope
Micron (1969)
Scanning Electron Microscope
Scanning Electron Microscope
