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Publications by Antoine Jay
Simulation of Single Particle Displacement Damage in Silicon–Part II: Generation and Long-Time Relaxation of Damage Structure
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Radiation Induced Variable Retention Time in Dynamic Random Access Memories
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
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Impact of Ultrafast Electronic Damage in Single-Particle X-Ray Imaging Experiments
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Single-Particle Relaxation Time in a Spatially Fluctuating Magnetic Field
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Comprehensive Model of Damage Accumulation in Silicon
Journal of Applied Physics
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Displacement Damage in Bipolar Linear Integrated Circuits
IEEE Transactions on Nuclear Science
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Ion Damage Calculations in Crystalline Silicon
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Mechanical Properties of Silicon in Subsurface Damage Layer From Nano-Grinding Studied by Atomistic Simulation
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Ionizing Doses and Displacement Damage Testing of COTS CMOS Imagers