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Publications by Anushka Gangnaik
Correlation of Lithographic Performance of the Electron Beam Resists SML and ZEP With Their Chemical Structure
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Surfaces
Electronic Engineering
Condensed Matter Physics
Instrumentation
Electronic
Optical
Materials Chemistry
Electrical
Magnetic Materials
Films
Process Chemistry
Coatings
Technology
Related publications
Study of PAG Size Effect on Lithographic Performance of 157nm Resists.
Journal of Photopolymer Science and Technology
Organic Chemistry
Polymers
Materials Chemistry
Plastics
Use of Supramolecular Assemblies as Lithographic Resists
Angewandte Chemie
Comparative Study of Thermally Cured and Electron-Beam-Exposed Hydrogen Silsesquioxane Resists
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Lithographic Characteristics of Alicyclic Polymer Based ArF Single Layer Resists.
Journal of Photopolymer Science and Technology
Organic Chemistry
Polymers
Materials Chemistry
Plastics
Lithographic Metrics for the Determination of Intrinsic Resolution Limits in EUV Resists
Correlation Between Electron Capture Detector Response and Chemical Structure for 1,2,3,4,5,6-Hexachlorocyclohexane
Bulletin of the Chemical Society of Japan
Chemistry
The Correlation Between the Electron-Capture Detector Response and the Chemical Structure for Polychlorinated Biphenyls
Bulletin of the Chemical Society of Japan
Chemistry
Chemical Composition of Electron‐beam Evaporated TiO2 Films
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Surfaces
Films
Interfaces
Condensed Matter Physics
Coatings
Cast Structure of Electron-Beam Melted Nb Alloy Ingots (The Electron Beam Melting of the Refractory Metals (X))
Nippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Mechanics of Materials
Alloys
Materials Chemistry
Condensed Matter Physics
Metals