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Publications by Ari N. Blumer
The Effect of Nonuniform Pixel Responses in CCD on Quantitative Analysis
Microscopy and Microanalysis
Instrumentation
Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis
Microscopy and Microanalysis
Instrumentation
